|
Volumn 1, Issue , 2006, Pages 591-594
|
New technique for analysing coplanar lines on ceramic up to 110GHz
|
Author keywords
Coplanar waveguide lines; LTCC; Microwave measurement; Multi chip module; Photoimageable thick film
|
Indexed keywords
CERAMIC MATERIALS;
COMPUTER NETWORKS;
MEASUREMENTS;
MICROFLUIDICS;
MICROWAVES;
MILLIMETER WAVES;
TECHNOLOGY;
WAVEGUIDES;
WAVES;
(1 1 0) SURFACE;
APPLIED (CO);
ASIA PACIFIC;
CHARACTERISATION;
CO PLANAR LINES;
CONFERENCE PROCEEDINGS;
COPLANAR WAVEGUIDE STRUCTURES;
MATERIAL CHARACTERISTICS;
MEASUREMENT TECHNIQUES;
MEASUREMENT-BASED;
MM WAVE FREQUENCIES;
THICK FILM TECHNOLOGY (TFT);
UNCERTAINTY ANALYSIS;
|
EID: 44849097900
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/APMC.2006.4429495 Document Type: Conference Paper |
Times cited : (1)
|
References (6)
|