Resistance of Escherichia coli grown at different temperatures to various environmental stresses

Journal of Applied Microbiology

Volumn 105, Issue 1, 2008, Pages 271-278

  Cebrian G ^a   Sagarzazu, N ^a   Pagan R ^a   Condon S ^a   Manas P ^a,b  

^a UNIVERSITY OF ZARAGOZA   (Spain)

^b Lab Genet Bioquim Grupos S   (Spain)

Author keywords

Growth temperature; Heat; Hydrogen peroxide; Membranes; Pulsed electric field

Indexed keywords

BACTERIOLOGY; CYTOLOGY; ELECTRIC FIELDS; ESCHERICHIA COLI; GROWTH TEMPERATURE; HEAT RESISTANCE; HYDROGEN PEROXIDE; OXIDATION; WEIBULL DISTRIBUTION;

BACTERIAL RESISTANCE; CELL-BE; CELL/B.E; CELL/BE; ENVIRONMENTAL STRESS; ESCHERICHIA COLI CELLS; HEAT; PULSED ELECTRIC FIELD; STATIONARY PHASE; SURVIVAL CURVES;

CELLS;

HYDROGEN PEROXIDE;

BIOACTIVITY; COLIFORM BACTERIUM; ELECTRIC FIELD; ENVIRONMENTAL STRESS; GROWTH RESPONSE; HEATING; HYDROGEN PEROXIDE; PHYSIOLOGY; SURVIVAL; TEMPERATURE EFFECT; WEIBULL THEORY;

ARTICLE; BACTERIAL GROWTH; BACTERIAL SURVIVAL; ENVIRONMENTAL STRESS; ESCHERICHIA COLI; HEAT; HEAT TREATMENT; NONHUMAN; PULSED ELECTRIC FIELD; TEMPERATURE;

BACTERIA (MICROORGANISMS); ESCHERICHIA COLI;

EID: 44849084445     PISSN: 13645072     EISSN: 13652672     Source Type: Journal    
DOI: 10.1111/j.1365-2672.2008.03745.x     Document Type: Article

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