Ion-beam analysis for cultural heritage on the AGLAE facility: Impact of PIXE/RBS combination

Applied Physics A: Materials Science and Processing

Volumn 92, Issue 1, 2008, Pages 43-50

  Salomon, J ^a   Dran, J C ^a   Guillou, T ^a   Moignard, B ^a   Pichon, L ^a   Walter, P ^a   Mathis, F ^b  

^a CENTRE DE RECHERCHE ET DE RESTAURATION DES MUSÉES DE FRANCE   (France)

^b UNIVERSITY OF LIÈGE   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM; ION SOURCES; PROTONS; RUTHERFORD BACKSCATTERING SPECTROSCOPY;

CULTURAL HERITAGE; ION-BEAM ANALYSIS; PIXE/RBS COMBINATION;

ION BEAMS;

EID: 44749094586     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s00339-008-4512-4     Document Type: Article

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