An improved experimental setup for the simultaneous PIXE analysis of heavy and light elements with a 3 MeV proton external beam

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 109-110, Issue , 1996, Pages 125-128

  Calligaro, T ^a   MacArthur, J D ^b   Salomon, J ^a  

^a Lab de Rech des Musees de France   (France)

^b QUEEN S UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTALS; PARTICLE BEAMS; PROTONS; RADIATION DETECTORS; TARGETS;

EXTERNAL BEAM LINE; PARTICLE INDUCED X RAY EMISSIONS (PIXE);

X RAY ANALYSIS;

EID: 0030120784     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01209-5     Document Type: Article

References (5)

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2. J.-L. Pouchou, Internal report, ONERA Department of Materials, 92320 Chatillon, France.
3. J.A. Maxwell et al., Nucl. Instr. and Meth, B 43 (1988) 218.
4. J.L. Campbell et al., Nucl. Instr. and Meth. B 77 (1993) 95.
5. Goudsmit Magnetic Systems BV, NL-5582 HA Waalre, The Netherlands.