Molecular mass concentrations for a powdered SRM sample using a quantitative single particle analysis

Analytica Chimica Acta

Volumn 619, Issue 1, 2008, Pages 14-19

  Khan, M S I ^a   Hwang, H ^a   Kim, H ^a   Ro, Chul Un ^a  

^a Inha University   (South Korea)

Author keywords

Energy dispersive electron probe X ray microanalysis; Low Z particle electron probe X ray microanalysis; Potassium feldspar; Single particle analysis; Standard reference material

Indexed keywords

AEROSOLS; DATA REDUCTION; FELDSPAR; MOLECULAR DYNAMICS; POTASSIUM COMPOUNDS;

ENERGY DISPERSIVE-ELECTRON PROBE X-RAY MICROANALYSIS; LOW-Z PARTICLE ELECTRON PROBE X-RAY MICROANALYSIS; POTASSIUM-FELDSPAR; SINGLE PARTICLE ANALYSIS; STANDARD REFERENCE MATERIALS;

PARTICLE SIZE ANALYSIS;

POTASSIUM;

ANALYTIC METHOD; ARTICLE; CHEMICAL COMPOSITION; CONCENTRATION (PARAMETERS); ELECTRON PROBE X RAY MICROANALYSIS; MATERIALS; MOLECULAR WEIGHT; PARTICULATE MATTER; POWDER; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; RELIABILITY;

EID: 44649202793     PISSN: 00032670     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.aca.2008.03.020     Document Type: Article

References (24)

1. Ro C.-U., Osan J., and Van Grieken R. Anal. Chem. 71 (1999) 1521
2. Ro C.-U., Oh K.Y., Osan J., de Hoog J., Worobiec A., and Van Grieken R. Anal. Chem. 73 (2001) 4574
3. Ro C.-U., Osan J., Szaloki I., de Hoog J., Worobiec A., and Van Grieken R. Anal. Chem. 75 (2003) 851
4. Szaloki I., Osan J., Ro C.-U., and Van Grieken R. Spectrochim. Acta B 55 (2000) 1017
5. Ro C.-U., Osan J., Szaloki I., and Van Grieken R. Environ. Sci. Technol. 34 (2000) 3023
6. Ro C.-U., Kim H., and Van Grieken R. Anal. Chem. 76 (2004) 1322
7. Hwang H., and Ro C.-U. Atmos. Environ. 40 (2006) 3869
8. Osan J., Ro C.-U., Szaloki I., and Van Grieken R. Mikrochim. Acta 132 (2000) 349
9. Ro C.-U., Oh K.Y., Kim H., Chun Y.S., Osan J., de Hoog J., and Van Grieken R. Atmos. Environ. 35 (2001) 4995
10. Ro C.-U., Oh K.Y., Kim H., Kim Y.P., Lee C.B., Kim K.H., Osan J., de Hoog J., Worobiec A., and Van Grieken R. Environ. Sci. Technol. 35 (2001) 4487
11. Ro C.-U., Kim H., Oh K.Y., Yea S.K., Lee C.B., Jang M., and Van Grieken R. Environ. Sci. Technol. 36 (2002) 4770
12. Ro C.-U., Hwang H., Kim H., Chun Y.S., and Van Grieken R. Environ. Sci. Technol. 39 (2005) 1409
13. de Hoog J., Osan J., Szaloki I., Eyckmans K., Worobiec A., Ro C.-U., and Van Grieken R. Atmos. Environ. 39 (2005) 3231
14. Hwang H., and Ro C.-U. J. Geophys. Res. 110 (2005) D23201
15. Hwang H., and Ro C.-U. Atmos. Environ. 40 (2006) 2873
16. Osan J., Torok S., Beckhoff B., Ulm G., Hwang H., Ro C.-U., and Abete C. R., Atmos. Environ. 40 (2006) 4691
17. https://srmors.nist.gov/view_cert.cfm?srm=70Aandsrm=1d
18. Vekemans B., Janssens K., Vincze L., Adams F., and Van Espen P. X-Ray Spectrom. 23 (1994) 278
19. Lide D.R. CRC Handbook of Chemistry and Physics. 85th ed. (2004), CRC Press
20. Ro C.-U., Hoornhaert S., and Van Grieken R. Anal. Chim. Acta 389 (1999) 151
21. Mamane Y., Willis R., and Conner T. Aerosol. Sci. Technol. 24 (2001) 97
22. Goldstein J.I., Newbury D.E., Joy D.C., Lyman C., Echlin P., Lifshin E., Sawyer L., and Michael J. Scanning Electron Microscopy and X-ray Microanalysis. 3rd ed. (2003), Kluwer-Plenum, New York
23. Jbara O., Fakhfakh S., Belhaj M., and Rondot S. Microsc. Microanal. 10 (2004) 697
24. Newbury D.E. Microsc. Microanal. 10 (2004) 739