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Volumn 266, Issue 10, 2008, Pages 2507-2510

Ion beam modification of structural and electrical properties of TiN thin films

Author keywords

Hard coatings; Ion beam modification; RBS; TEM; TiN

Indexed keywords

ARGON; ELECTRIC PROPERTIES; ION BEAMS; TITANIUM NITRIDE;

EID: 44649108220     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.032     Document Type: Article
Times cited : (15)

References (10)
  • 7
    • 0003828439 scopus 로고
    • Seah M., and Briggs D. (Eds), Wiley
    • Webb R.P. In: Seah M., and Briggs D. (Eds). Practical Surface Analysis Vol. 3 (1991), Wiley. (Appendix 3)
    • (1991) Practical Surface Analysis , vol.3
    • Webb, R.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.