Detection of simulated defect using IR temperature sensors and one point heating

Sensors

Volumn 8, Issue 5, 2008, Pages 3345-3354

  Kim, Byoung Chul ^a   Heo, Young Gun ^a   Suh, Yong Kweon ^a   Kim, Young Han ^a  

^a Dong A University   (South Korea)

Author keywords

Defect detection; IR thermometer; Nondestructive detection; Thermography

Indexed keywords

ALUMINUM CYLINDERS; CONDUCTION EQUATIONS; DEFECT DETECTION; INFRARED TEMPERATURE SENSOR; IR TEMPERATURE SENSORS; MEASUREMENT OF TEMPERATURE; NONDESTRUCTIVE DETECTION; TEMPERATURE PROFILES;

CYLINDERS (SHAPES); DEFECTS; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT; TEMPERATURE SENSORS; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

SURFACE DEFECTS;

EID: 44649106399     PISSN: 14248220     EISSN: None     Source Type: Journal    
DOI: 10.3390/s8053345     Document Type: Article

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