IR self-referencing thermography for detection of in-depth defects

Infrared Physics and Technology

Volumn 46, Issue 4, 2005, Pages 283-289

  Omar, M ^a   Hassan, M I ^a   Saito, K ^a   Alloo, R ^b  

^a UNIVERSITY OF KENTUCKY   (United States)

^b Toyota Motor Mfg North America Inc   (United States)

Author keywords

Adhesion Integrity; Hot spot detection; Infrared tomography; Self referencing; Thermal absolute contrast

Indexed keywords

ALGORITHMS; AUTOMATION; CARBON FIBER REINFORCED PLASTICS; FREQUENCIES; IMAGE QUALITY; MATRIX ALGEBRA; TRANSDUCERS; ULTRASONIC DEVICES;

ADHESION INTEGRITY; HOT SPOT DETECTION; INFRARED TOMOGRAPHY; SELF-REFERENCING; THERMAL ABSOLUTE CONTRAST;

INFRARED IMAGING;

EID: 15344350422     PISSN: 13504495     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.infrared.2004.04.005     Document Type: Article

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