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Journal of Non-Crystalline Solids

Volumn 297, Issue 2-3, 2002, Pages 156-172

Structure of amorphous GexSe1-x and GexSeyZnz thin films: An EXAFS study

(3) Choi, J a Gurman, S J a Davis, E A a

a UNIVERSITY OF LEICESTER (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHEMICAL BONDS; SEMICONDUCTING GERMANIUM COMPOUNDS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

EXTENDED X-RAY ABSORPTION FINE STRUCTURES (EXAFS);

THIN FILMS;

EID: 0036468341 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-3093(01)00937-1 Document Type: Article

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.