Possible origin of superior corrosion resistance for electrodeposited nanocrystalline Ni

Scripta Materialia

Volumn 59, Issue 3, 2008, Pages 305-308

  Roy, I ^a,b   Yang, H W ^a   Dinh, L ^a   Lund, I ^c   Earthman, J C ^a   Mohamed, F A ^a  

^a University of California at Irvine   (United States)

^b SCHLUMBERGER   (United States)

^c ITT Industries EC (Cannon)   (United States)

Author keywords

Coincidence site lattice (CSL) boundaries; Corrosion; Electron backscatter diffraction (EBSD) maps; Nanocrystalline Ni; Orientation imaging microscopy (OIM)

Indexed keywords

BACKSCATTERING; CORROSION RESISTANCE; ELECTRODEPOSITION; ELECTRON DIFFRACTION; IMAGING SYSTEMS; NICKEL; VOLUME FRACTION;

COINCIDENCE SITE LATTICE (CSL); ELECTRON BACKSCATTER DIFFRACTION (EBSD); ORIENTATION IMAGING MICROSCOPY (OIM);

NANOCRYSTALLINE MATERIALS;

EID: 44449141782     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2008.03.033     Document Type: Article

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