Direct multielement trace analyses of silicon carbide powders by spark ablation simultaneous inductively coupled plasma optical emission spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 63, Issue 2, 2008, Pages 287-292

  Kiera, Arne F ^a   Schmidt Lehr, Sebastian ^a   Song, Ming ^a   Bings, Nicolas H ^a   Broekaert, José A C ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

Inductively coupled plasma optical emission spectrometry; SA ICP OES; Silicon carbide; Spark ablation

Indexed keywords

INDUCTIVELY COUPLED PLASMA; OPTICAL EMISSION SPECTROSCOPY; TRACE ANALYSIS; TRACE ELEMENTS;

CONDUCTING MATRIX; SILICON CARBIDE POWDERS; STANDARD DEVIATIONS;

SILICON CARBIDE;

EID: 44449119582     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2007.11.016     Document Type: Article

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