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Volumn 266, Issue 11, 2008, Pages 2572-2575

The interdiffusion and solid-state reaction of low-energy copper ions implanted in silicon

Author keywords

Interdiffusion; Interfacial reaction; Ion implantation; RBS; Silicide; XRD

Indexed keywords

DIFFUSION; REACTION KINETICS; SURFACE CHEMISTRY; X RAY DIFFRACTION ANALYSIS;

EID: 44449093105     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.03.082     Document Type: Article
Times cited : (8)

References (25)
  • 5
    • 0345383501 scopus 로고
    • Surf. Sci. Rep.
    • Rossi G. Surf. Sci. Rep. 7 (1987) 1
    • (1987) 7 , pp. 1
    • Rossi, G.1
  • 25
    • 44449117020 scopus 로고    scopus 로고
    • E. S. Microware, Inc.
    • E. S. Microware, Inc.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.