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Volumn 266, Issue 11, 2008, Pages 2572-2575
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The interdiffusion and solid-state reaction of low-energy copper ions implanted in silicon
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Author keywords
Interdiffusion; Interfacial reaction; Ion implantation; RBS; Silicide; XRD
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Indexed keywords
DIFFUSION;
REACTION KINETICS;
SURFACE CHEMISTRY;
X RAY DIFFRACTION ANALYSIS;
INTERDIFFUSION;
INTERFACIAL REACTION;
SILICIDES;
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EID: 44449093105
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2008.03.082 Document Type: Article |
Times cited : (8)
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References (25)
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