Analyses of eutectoid phase transformations in Nb-silicide in situ composites

Microscopy and Microanalysis

Volumn 10, Issue 4, 2004, Pages 470-480

  Bewlay, B P ^a   Sitzman, S D ^b   Brewer, L N ^a   Jackson, M R ^a  

^a GE GLOBAL RESEARCH   (United States)

^b HKL Technology Inc   (United States)

Author keywords

Composite; Creep; High temperature; hP16; Niobium; Silicide; tI32; tP32

Indexed keywords

EID: 4444360562     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040760     Document Type: Article

References (17)

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