Evidence for the existence of Hf5Si3

Journal of Phase Equilibria

Volumn 20, Issue 2, 1999, Pages 109-112

  Bewlay, B P ^a   Sutliff, J A ^a   Bishop, R R ^b  

^a GENERAL ELECTRIC COMPANY   (United States)

^b Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; BINARY ALLOYS; ELECTRON SCATTERING; MANGANESE ALLOYS; PHASE DIAGRAMS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

HAFNIUM SILICIDE;

HAFNIUM ALLOYS;

EID: 0032632149     PISSN: 10549714     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11669-999-0008-y     Document Type: Article

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