Using dynamic reliability models to extend the economic life of strongly innovative products

IEEE International Symposium on Electronics and the Environment

Volumn , Issue , 2004, Pages 220-225

  Van Den Bogaard, J A ^a,b,c   Shangguan, D ^a   Jayaram, J S R ^c   Hulsken, G ^a   Brombacher, A C ^b,c   Ion, R A ^b  

^a Flextronics   (Netherlands)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c Design Technology Institute   (Singapore)

Author keywords

Design optimization; Re use; Reliability modeling; Reliability prediction; Robust design

Indexed keywords

RE-USE; RELIABILITY MODELING; RELIABILITY PREDICTION; ROBUST DESIGN;

COMPUTER SIMULATION; CUSTOMER SATISFACTION; ENVIRONMENTAL IMPACT; LIFE CYCLE; OPTIMIZATION; PROBLEM SOLVING; PRODUCT DEVELOPMENT; RECYCLING; RELIABILITY; ROBUSTNESS (CONTROL SYSTEMS); STATISTICAL METHODS;

PRODUCT DESIGN;

EID: 4444343576     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)

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