A method for reliability optimization through degradation analysis and robust design

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2003, Pages 55-62

  Van Den Bogaard, Johannes A ^a   Shreeram, Jaya ^b   Brombacher, Aarnout C ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Reliability optimization; Reliability prediction; Robust design

Indexed keywords

COMPUTER SIMULATION; FITS AND TOLERANCES; OPTIMIZATION; PROBABILITY; PRODUCT DESIGN; PRODUCT DEVELOPMENT; STATISTICS;

RELIABILITY OPTIMIZATION; RELIABILITY PREDICTION; ROBUST DESIGN;

RELIABILITY;

EID: 0037255887     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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