Soft magnetic properties of Co69.9Fe20.5Al 4.4O5.2 thin films

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 2727-2729

  Ha, Nguyen Duy ^a   Park, Bum Chan ^a   Kim, Cheol Gi ^a   Min, B K ^b   Kim, Chong Oh ^a  

^a Chungnam National University   (South Korea)

^b Korea Electrotechnology Research Institute (KERI)   (South Korea)

Author keywords

CoFeAlO thin films; Granular materials; Nanocrystalline materials; Soft magnetic thin films; Ultrahigh frequency

Indexed keywords

FERROMAGNETIC MATERIALS; GRANULAR MATERIALS; MAGNETIC ANISOTROPY; MAGNETIC MATERIALS; NANOSTRUCTURED MATERIALS; PROFILOMETRY; SPUTTERING; TRANSMISSION ELECTRON MICROSCOPY; UHF DEVICES; WAVELENGTH DISPERSIVE SPECTROSCOPY; X RAY DIFFRACTION ANALYSIS;

ELECTRICAL RESISTIVITY; OXIDE PHASE; SELECTED AREA DIFFRACTION (SAD); SOFT MAGNETIC THIN FILMS;

MAGNETIC THIN FILMS;

EID: 4444342791     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.829178     Document Type: Article

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