Quantitative analysis of micro-corrosion on magnetic recording disk using TOF SIMS

IEEE Transactions on Magnetics

Volumn 40, Issue 4 II, 2004, Pages 3192-3194

  Ji, Rong ^a   Liew, Thomas ^a   Chong, T C ^a  

^a DATA STORAGE INSTITUTE   (Singapore)

Author keywords

Corrosion, hard disk; Quantitative analysis; Time of flight secondary ion mass spectroscopy (TOF SIMS)

Indexed keywords

CHEMICAL ANALYSIS; COBALT; CORROSION; DATA ACQUISITION; MAGNETIC RECORDING; MASS SPECTROMETRY; MONOLAYERS; NICKEL; OPTICAL MICROSCOPY; SAMPLING; SIGNAL DETECTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ATOMIC CONCENTRATIONS; BEAM ENERGY; CORROSION PRODUCTS; TIME-OF FLIGHT SECONDARY ION MASS SPECTROSCOPY (TOF SIMS);

HARD DISK STORAGE;

EID: 4444335469     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.828954     Document Type: Article

References (5)

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