Effect of surface roughness on the optical constants of ZnS xSe 1-x thin films

Physica Status Solidi (A) Applied Research

Volumn 201, Issue 10, 2004, Pages 2366-2369

  Rojas, F E ^a   Rodriguez J A ^a   Quinones C ^a   Rodriguez O ^a   Gordillo, G ^a  

^a UNIVERSIDAD NACIONAL DE COLOMBIA   (Colombia)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION COEFFICIENT; OPTICAL CONSTANTS; SPECTRAL TRANSMITTANCE; THICKNESS VARIATION;

ALGORITHMS; ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; EVAPORATION; ITERATIVE METHODS; LIGHT ABSORPTION; LIGHT TRANSMISSION; OPTICAL SYSTEMS; REFRACTIVE INDEX; SURFACE ROUGHNESS; THIN FILMS; ZINC SULFIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 4444326588     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200304906     Document Type: Conference Paper

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