Measurements of low-frequency noise spectral densities for a small-sized stack of intrinsic Josephson junctions of Bi2Sr2CaCu 2Oy single crystal

Applied Physics Letters

Volumn 85, Issue 7, 2004, Pages 1196-1198

  Saito, A ^a   Ishida, H ^b   Hamasaki, K ^b   Irie, A ^c   Oya, G ^c  

^a YAMAGATA UNIVERSITY   (Japan)

^b NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^c UTSUNOMIYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ARGON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON BEAM LITHOGRAPHY; ELECTRON TUNNELING; SEMICONDUCTING BISMUTH COMPOUNDS; SINGLE CRYSTALS; SQUIDS;

ARGON-ION ETCHING; INTRINSIC JOSEPHSON JUNCTIONS (IJJ); LORENTZ-BUMP STRUCTURES; LOW-FREQUENCY NOISE (LFN) SPECTROSCOPY;

JOSEPHSON JUNCTION DEVICES;

EID: 4444290647     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1780601     Document Type: Article

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