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Volumn 11, Issue 1 I, 2001, Pages 304-307
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Random telegraph voltage noise in a Bi2Sr2CaCu2O8+x intrinsic Josephson junction
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Author keywords
Bi2Sr2CaCu2O8+x mesa; Machlup formula; Random telegraph voltage noise; Switchback voltage
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Indexed keywords
AMPLIFIERS (ELECTRONIC);
BISMUTH COMPOUNDS;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC POTENTIAL;
ETCHING;
LOW TEMPERATURE PROPERTIES;
OXIDE SUPERCONDUCTORS;
PHOTOLITHOGRAPHY;
SINGLE CRYSTALS;
SPECTRUM ANALYZERS;
SPURIOUS SIGNAL NOISE;
MACHLUP FORMULA;
MESA;
RANDOM TELEGRAPH VOLTAGE NOISE;
SWITCHBACK VOLTAGE;
JOSEPHSON JUNCTION DEVICES;
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EID: 0035268738
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/77.919344 Document Type: Conference Paper |
Times cited : (8)
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References (15)
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