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Volumn 11, Issue 1 I, 2001, Pages 304-307

Random telegraph voltage noise in a Bi2Sr2CaCu2O8+x intrinsic Josephson junction

Author keywords

Bi2Sr2CaCu2O8+x mesa; Machlup formula; Random telegraph voltage noise; Switchback voltage

Indexed keywords

AMPLIFIERS (ELECTRONIC); BISMUTH COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC POTENTIAL; ETCHING; LOW TEMPERATURE PROPERTIES; OXIDE SUPERCONDUCTORS; PHOTOLITHOGRAPHY; SINGLE CRYSTALS; SPECTRUM ANALYZERS; SPURIOUS SIGNAL NOISE;

EID: 0035268738     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.919344     Document Type: Conference Paper
Times cited : (8)

References (15)
  • 6
    • 0001033807 scopus 로고    scopus 로고
    • Dynamical breaking of charge neutrality in intrinsic josephson junctions: Common origin for microwave resonant absorptions and multiple-branch structures in the I-V characteristics
    • Nov.
    • (1999) Phys. Rev. Lett. , vol.83 , Issue.22 , pp. 4618-4621
    • Machida, M.1    Koyama, T.2    Tachiki, M.3
  • 13
    • 36849124063 scopus 로고
    • Noise in semiconductors: Spectrum of a two-parameter random signal
    • Mar.
    • (1954) J. Appl. Phys. , vol.25 , Issue.3 , pp. 341-343
    • Machlup, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.