Interference effects in photoacoustic and reflectance spectroscopies on TiO2/Si structures and TiO2 band gap

Applied Spectroscopy

Volumn 58, Issue 8, 2004, Pages 917-921

  Conde Gallardo, A ^a   Cruz Orea, A ^a   Tomas, S A ^a  

^a DEPARTAMENTO DE FÍSICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFERENCE EFFECTS; MULTIPLE REFLECTIONS; REFLECTANCE SPECTROSCOPIES; SILICON SUBSTRATES;

DEPOSITION; ENERGY GAP; LIGHT ABSORPTION; LIGHT REFLECTION; LIGHT TRANSMISSION; MATHEMATICAL MODELS; SILICON; THERMAL DIFFUSION; THICKNESS MEASUREMENT; THIN FILMS; TITANIUM DIOXIDE; TRANSPARENCY;

PHOTOACOUSTIC SPECTROSCOPY;

EID: 4444288467     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702041655449     Document Type: Article

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