Quantitative analysis of the x-ray photoelectron spectrum of zirconium

Surface and Interface Analysis

Volumn 36, Issue 8, 2004, Pages 812-815

  Lyapin, A ^a   Graat, P C J ^a,b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

Intrinsic and extrinsic plasmon excitations; X ray photoelectron spectroscopy (XPS); Zirconium

Indexed keywords

INTRINSIC AND EXTRINSIC PLASMON EXCITATIONS; LORENTZ FUNCTION; PHOTON ENERGY; X-RAY ENERGY DISTRIBUTION;

BINDING ENERGY; ELECTRON SCATTERING; ENERGY DISSIPATION; ERROR ANALYSIS; SURFACE CHEMISTRY; ZIRCONIUM;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 4444251492     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1771     Document Type: Conference Paper

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