AE behavior of smart stress memory patch after variable amplitude loading

Modern Physics Letters B

Volumn 22, Issue 11, 2008, Pages 1105-1110

  Fujino, Y ^a   Nambu, S ^a   Enoki, M ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 44349114461     PISSN: 02179849     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0217984908015917     Document Type: Article

References (5)

1. Y. Fujimoto et al., Ship Technology Research 49, 33-44 (2002).
2. T. Kobayashi et al., Key Engineering Materials 261-263, 1313-1318 (2004).
3. S. Nambu et al., Mater. Trans. 48, 6, 1244-1248 (2007).
4. M. Sander et al., Fatigue Fract Engng Mater Struct. 29, 291-301 (2006).
5. M. Sander et al., Fatigue Fract Engng Mater Struct. 29, 303-319 (2006).