Smart stress-memory patch for fatigue damage of structure

Materials Transactions

Volumn 48, Issue 6, 2007, Pages 1244-1248

  Nambu, Shoichi ^a   Enoki, Manabu ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

Acoustic emission; Electrodeposited copper; Fatigue crack growth; Fatigue sensor; Health monitoring

Indexed keywords

ELECTRODEPOSITED COPPER; FATIGUE SENSORS; STRESS RATIO;

ACOUSTIC EMISSIONS; ELECTRODEPOSITION; FATIGUE CRACK PROPAGATION; STRESS ANALYSIS; STRUCTURAL HEALTH MONITORING;

SMART SENSORS;

EID: 34547477205     PISSN: 13459678     EISSN: None     Source Type: Journal    
DOI: 10.2320/matertrans.I-MRA2007853     Document Type: Article

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