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Volumn 27, Issue 6, 2008, Pages 1150-1154
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Crosstalk analysis for a CMOS-gate-driven coupled interconnects
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Author keywords
Coupling; Crosstalk noise; Inductance; Integrated circuit interconnect; Signal integrity; Transmission lines
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Indexed keywords
CMOS INTEGRATED CIRCUITS;
INDUCTANCE;
MOSFET DEVICES;
SPICE;
CROSSTALK NOISE;
SIGNAL INTEGRITY;
CROSSTALK;
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EID: 44149127763
PISSN: 02780070
EISSN: None
Source Type: Journal
DOI: 10.1109/TCAD.2008.923259 Document Type: Article |
Times cited : (67)
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References (4)
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