Variable sample temperature scanning superconducting quantum interference device microscope

Applied Physics Letters

Volumn 74, Issue 26, 1999, Pages 4011-4013

  Kirtley, J R ^a   Tsuei, C C ^a   Moler, K A ^b   Kogan, V G ^c   Clem, J R ^c   Turberfield, A J ^d  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b STANFORD UNIVERSITY   (United States)

^c IOWA STATE UNIVERSITY   (United States)

^d UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE SUPERCONDUCTORS; MICROSCOPES; OXIDE SUPERCONDUCTORS; THERMAL EFFECTS; YTTRIUM BARIUM COPPER OXIDES;

SCANNING SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MICROSCOPES;

SQUIDS;

EID: 0032614279     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123244     Document Type: Article

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