New display-type analyzer for three-dimensional fermi surface mapping and atomic orbital analysis

AIP Conference Proceedings

Volumn 879, Issue , 2007, Pages 1180-1186

  Takahashi, Nobuaki ^a   Matsui, Fumihiko ^a,b   Matsuda, Hiroyuki ^a   Shigenai, Shin ^a   Hirama, Yoshiteru ^a   Hamada, Yoji ^c   Nakanishi, Koji ^c   Namba, Hidetoshi ^c   Kitamura, Toshiro ^d   Soejima, Hiroyoshi ^d   Daimon, Hiroshi ^a,b,c  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c RITSUMEIKAN UNIVERSITY   (Japan)

^d Bio Medical System   (Japan)

Author keywords

Angle resolved photoelectron spectroscopy (ARPES); Photoelectron intensity angular distribution (PIAD); Two dimensional photoelectron spectroscopy

Indexed keywords

EID: 33947389893     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.2436275     Document Type: Conference Paper

References (6)

1. S. Hüfner, Photoelectron Spectroscopy (Springer-Verlag, Berlin, 1995).
2. H. Daimon, Rev. Sci. Instrum. 59, 545 (1988).
3. T. Nohno, F. Matsui, Y. Hamada, H. Daimon, et. al., Jpn. J. Appl. Phys. Vol. 42 (2003) 4752-4755.
4. Y. Tokura, N. Nagase, Science, 288, 462 (2000).
5. F. Matsui, Y. Hori, H. Miyata, N. Suganuma, H. Daimon, et. al., Appl. Phys. Lett., 81, 2556 (2002).
6. F. Matsui, H. Miyata, O. Rader, Y. Hamada, Y. Nakamura, K. Nakanishi, H. Daimon, et. al., Phys. Rev. B 72, 195417 (2005).