Strain measurement of nickel thin film by a digital image correlation method

Strain

Volumn 44, Issue 3, 2008, Pages 215-222

  Hwang, S F ^a   Horn, J T ^a   Wang, H J ^a  

^a NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Digital image correlation; Genetic algorithm; Microtensile test; Nickel; Strain

Indexed keywords

DEFORMATION; GENETIC ALGORITHMS; IMAGE PROCESSING; MECHANICAL PROPERTIES; STRAIN MEASUREMENT; TENSILE TESTING;

DIGITAL IMAGE CORRELATION; DOUBLE REGION METHOD; SINGLE-REGION METHOD;

NICKEL;

EID: 43749102656     PISSN: 00392103     EISSN: 14751305     Source Type: Journal    
DOI: 10.1111/j.1475-1305.2007.00356.x     Document Type: Conference Paper

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