Degradation state model-based prognosis for proactively maintaining product performance

CIRP Annals - Manufacturing Technology

Volumn 57, Issue 1, 2008, Pages 49-52

  Iung, B ^a   Monnin, M ^a   Voisin, A ^a   Cocheteux, P ^a   Levrat, E ^a  

^a CENTRE DE RECHERCHE EN AUTOMATIQUE DE NANCY   (France)

Author keywords

Failure Model; Maintenance; Prognosis

Indexed keywords

COST EFFECTIVENESS; FAILURE ANALYSIS; FUNCTION EVALUATION; MATHEMATICAL MODELS;

COMPONENT DEGRADATION MODEL; FAILURE MODELS; HEALTH MONITORING; PROGNOSIS PROCESS;

MAINTENANCE;

EID: 43649095456     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2008.03.026     Document Type: Article

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