Evaluation of FinFET RF building blocks

Proceedings - IEEE International SOI Conference

Volumn , Issue , 2007, Pages 39-40

  Knoblinger, G ^a   Fulde, M ^a,b   Siprak, D ^c   Hodel, U ^c   Von Arnim, K ^c   Schulz, Th ^c   Pacha, C ^c   Baumann, U ^d   Marshall, A ^e   Xiong, W ^e   Cleavelin, C R ^e   Patruno, P ^f   Schruefer, K ^c  

^a INFINEON TECHNOLOGIES AUSTRIA AG   (Austria)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c INFINEON TECHNOLOGIES AG   (Germany)

^d IMMS   (Germany)

^e TEXAS INSTRUMENTS   (United States)

^f PARC TECHNOLOGIQUE DES FONTAINES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 43549105332     PISSN: 1078621X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SOI.2007.4357842     Document Type: Conference Paper

References (7)

1. G. Knoblinger et al., SOI, 2005, pp. 39-40.
2. C. Pacha et al., ISSCC, 2006, pp. 1656-1665.
3. K. von Arnim et al, VSLI Symp., 2007, in press
4. Z. Rittersma et al., IEEE Trans. Electron Devices, 2006, pp. 1216-1225
5. M. Denan et al, SMICRF1 2007, pp .28-31
6. M. Fulde et al., ISCAS, 2007, in press
7. G. Knoblinger et al., JSSC, 2001, pp. 831-837