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Volumn 354, Issue 28, 2008, Pages 3241-3245
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Application of the optical method for determining of the RMS roughness of porous glass surfaces
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Author keywords
Atomic force and scanning tunneling microscopy; Glasses; Optical spectroscopy; Porosity; Reflectivity
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
REFLECTION;
SPECTRUM ANALYSIS;
SURFACE ROUGHNESS;
OPTICAL METHODS;
REFLECTANCE SPECTRA;
ROOT MEAN SQUARE;
GLASS;
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EID: 43549094928
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2008.02.013 Document Type: Article |
Times cited : (6)
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References (15)
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