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Volumn 354, Issue 28, 2008, Pages 3241-3245

Application of the optical method for determining of the RMS roughness of porous glass surfaces

Author keywords

Atomic force and scanning tunneling microscopy; Glasses; Optical spectroscopy; Porosity; Reflectivity

Indexed keywords

ATOMIC FORCE MICROSCOPY; REFLECTION; SPECTRUM ANALYSIS; SURFACE ROUGHNESS;

EID: 43549094928     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.02.013     Document Type: Article
Times cited : (6)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.