Applications of fullerene beams in analysis of thin layers

Vacuum

Volumn 82, Issue 10, 2008, Pages 1120-1123

  Czerwinski B ^a   Rzeznik L ^a   Stachura, K ^a   Paruch, R ^a   Garrison, B J ^b   Postawa, Z ^a  

^a JAGIELLONIAN UNIVERSITY   (Poland)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

Cluster bombardment; Molecular dynamics; Organic overlayers; SIMS SNMS; Sputtering

Indexed keywords

COMPUTER SIMULATION; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; SUBSTRATES;

CLUSTER BOMBARDMENT; ORGANIC OVERLAYERS;

FULLERENES;

EID: 43449085783     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2008.01.042     Document Type: Article

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