EXAFS-analysis of phase formation and modification induced by swift heavy ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 225, Issue 1-2 SPEC. ISS., 2004, Pages 160-168

  Mahnke, H E ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

Defects; Ion beam modification; Ion tracks; Local structure; Nanoclusters; XAFS

Indexed keywords

ABSORPTION; BACKSCATTERING; ELECTRON EMISSION; ELECTRONIC STRUCTURE; FLUORESCENCE; NANOSTRUCTURED MATERIALS; X RAYS;

ION BEAM MODIFICATIONS; ION TRACKS; LOCAL STRUCTURE; NANOCLUSTERS; XAFS;

ION BEAMS;

EID: 4344716279     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.04.189     Document Type: Conference Paper

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