Piezoresistive properties of ITO strain sensors prepared with controlled nanoporosity

Journal of the Electrochemical Society

Volumn 151, Issue 8, 2004, Pages

  Gregory, Otto J ^a   You, Tao ^a  

^a The University of Rhode Island   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE SURFACES; ELECTRICAL ISOLATION; SINTERING RATE; STATIC STRAIN TESTING;

ANNEALING; GRAIN BOUNDARIES; NANOSTRUCTURED MATERIALS; PIEZOELECTRICITY; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SPUTTERING; STABILITY; STRAIN; THIN FILMS;

SENSORS;

EID: 4344690762     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1767839     Document Type: Article

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