Speedier reliability analysis

Quality Progress

Volumn 36, Issue 6, 2003, Pages 58-64

  Hahn, Gerald J ^a   Meeker, William Q ^b   Doganaksoy, Necip ^a  

^a GE GLOBAL RESEARCH   (United States)

^b IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CUSTOMER SATISFACTION; MAXIMUM LIKELIHOOD ESTIMATION; PLANNING; PRODUCT DEVELOPMENT; SAMPLING; SERVICE LIFE; WEIBULL DISTRIBUTION;

ACCELERATED LIFE TESTS; BASELINE TESTING;

RELIABILITY;

EID: 0037870608     PISSN: 0033524X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

1. Gerald J. Hahn, Necip Doganaksoy and William Q. Meeker, "Reliability Improvement: Issues and Tools," Quality Progress, June 1999, pp. 133-139.
2. Necip Doganaksoy, Gerald J. Hahn and William Q. Meeker, "Product Life Data Analysis: A Case Study," Quality Progress, June 2000, pp. 115-121.
3. William Q. Meeker and L.A. Escobar, Statistical Methods for Reliability Data, John Wiley and Sons, 1998.
4. Wayne Nelson, Accelerated Testing: Statistical Models, Test Plans and Data Analyses, John Wiley & Sons, 1990.
5. Meeker, Statistical Methods for Reliability Data, see reference 3.
6. I b i d.
7. Nelson, Accelerated Testing: Statistical Models, Test Plans and Data Analyses, see reference 4.
8. P.A. Tobias and D.C. Trindade, Applied Reliability, second edition, CRC Press, 1995.
9. Gerald J. Hahn and William Q. Meeker, "Pitfalls and Practical Considerations in Product Life Analysis," Journal of Quality Technology, 1982, pp. 144-152.
10. Necip Doganaksoy, William Q. Meeker and Gerald J. Hahn, "Reliability Analysis by Failure Mode," Quality Progress, June 2002, pp. 47-52.
11. William Q. Meeker, Necip Doganaksoy and Gerald J. Hahn, "Using Degradation Data for Product Reliability Analysis," Quality Progress, June 2001, pp. 60-65.