Effects of degree of three-dimensional order and Fe impurities on photoluminescence of boron nitride

Journal of Applied Physics

Volumn 96, Issue 4, 2004, Pages 1947-1952

  Yao, B ^a   Liu, Li ^a   Su, W H ^a   Shen, Z X ^b   Liu, L ^b   Sun, W X ^b   Ding, J ^b  

^a JILIN UNIVERSITY   (China)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CONTAMINATION; IMPURITIES; IRON; MOSSBAUER SPECTROSCOPY; OPTOELECTRONIC DEVICES; PHOTOLUMINESCENCE; STAINLESS STEEL; THERMAL CONDUCTIVITY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURE; DIFFRACTION PEAKS; MECHANICAL MILLING; VALANCE BAND;

BORON COMPOUNDS;

EID: 4344624490     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1772880     Document Type: Article

References (32)

1. A. Zunger, A. Katzir, and A. Halperin, Phys. Rev. B 13, 5560 (1976).
2. D. M. Hoffman, G. L. Doll, and P. C. Eklund, Phys. Rev. B 30, 6051 (1984).
3. V. L. Solozhenko, A. G. Lazarenko, J. P. Petitet, and A. V. Kanaev, J. Phys. Chem. Solids 62, 1331 (2001).
4. J. Thomas, Jr., N. E. Weston, and T. E. O'Conner, J. Am. Chem. Soc. 84, 4619 (1963).
5. S. Alkoy, C. Toy, T. Gönül, and A. Tekin, J. Bur. Ceram. Soc. 17, 1415 (1997).
6. S. Larach and R. E. Shrader, Phys. Rev. 104, 68 (1956).
7. D. N. Bose and H. K. Hensch, J. Am. Chem. Soc. 53, 281 (1970).
8. A. Katzir, J. T. Suss, A. Zunger, and A. Halperin, Phys. Rev. B 11, 2370 (1975).
9. E. J. Andrey, A. Katzir, and J. T. Suss, Phys. Rev. B 13, 2831 (1976).
10. K. Era, R Minami, and T. Kuzuba, J. Lumin. 24/25, 71 (1981).
11. A. W. Moore and L. S. Singer, J. Phys. Chem. Solids 33, 343 (1972).
12. M. Kawaguchi, K. Nozaki, Y. Kita, and M. Doi, J. Mater. Sci. 26, 3926 (1991).
13. V. V. Lopatin and F. V. Konusov, J. Phys. Chem. Solids 53, 847 (1992).
14. H. Kobayashi, H. Shibata, and S. Tagawa, Nucl. Instrum. Methods Phys. Res. B 90, 556 (1994).
15. C. A. Taylor II, S. W. Brown, V. Subramaniam, S. Kidner, S. C. Rand, and R. Clarke, Appl. Phys. Lett. 65, 1251 (1994).
16. X. T. Li, C. L. Shao, S. L. Qiu, F. S. Xiao, W. T. Zheng, P. L. Ying, and O. Terasaki, Microporous Mesoporous Mater. 40, 263 (2000).
17. X. T. Li, C. L. Shao, S. L. Qiu, F. S. Xiao, W. T. Zheng, and O. Terasaki, Mater. Lett. 44, 341 (2000).
18. J. M. Hamilton, S. E. Dolan, C. M. Mann, H. O. Colijn, C. A. Medonald, and S. G. Shore, Science 260, 659 (1993).
19. E. J. M. Hamilton, S. E. Dolan, C. M. Mann, H. O. Colijn, C. A. Mcdonald, and S. G. Shore, Chem. Mater. 7, 111 (1995).
20. T. Kobayashi, S. Tashiro, T. Sekine, and T. Sato, Chem. Mater. 9, 233 (1997).
21. J. Y. Huang, H. Yashuda, and H. Mori, J. Am. Ceram. Soc. 83, 403 (2000).
22. 22 Joint committee of powder diffraction standard (JCPDS)-Intemational Center for Diffraction Data, No. 73-2095.
23. R. S. Pease, Acta Crystallogr. 5, 356 (1952).
24. R. Z. Nemanich, S. A. Solin, and R. M Martin, Phys. Rev. B 23, 6348 (1981).
25. B. Yao, L. Liu, S. E. Liu, X. Hu, and W. H. Su, J. Mater. Res. 16, 2583 (2001).
26. B. Yao, L. Liu, S. E. Liu, W. H. Su, and Y Li, J. Non-Cryst. Solids 277, 91 (2000).
27. J. Siwiec, A. Sokolowska, A. Olszyna, R. Dwillinski, M. Kaminska, and J. Konwerska-Hrabowska, Nanostruct. Mater. 10, 625 (1998).
28. K. H. Jack, Proc. R. Soc. London, Ser. A 208, 200 (1951).
29. T. W. Dobson and J. F. Wager, J. Appl. Phys. 65, 1997 (1989).
30. K. Kuriyama, K. Sakai, M. Okada, and K Yokoyama, Phys. Rev. B 52, 14578 (1995).
31. Y. W. Zhao, H. W. Dong, Y. H. Zhang, J. H. Jiao, J. Q. Zhao, and L. Y. Lin, Appl. Phys. Lett. 80, 2878 (2002).
32. Y. P. Varshni, Physica (Amsterdam) 34, 149 (1967).