Characterization of charge-pump rectifiers for standard submicron CMOS processes

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 5, Issue , 2004, Pages

  Hooper, Mark ^a   Kucic, Matt ^a   Hasler, Paul ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE PUMPS; CHARGE-PUMP RECTIFIERS; FLOATING GATE CIRCUITS; VOLTAGE SOURCES;

DYNAMIC RANDOM ACCESS STORAGE; ELECTRIC CHARGE; ELECTRIC POTENTIAL; ELECTRIC RECTIFIERS; INTEGRATED CIRCUIT LAYOUT; SWITCHING;

CMOS INTEGRATED CIRCUITS;

EID: 4344593826     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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