AFM investigations of the morphology features and local mechanical properties of HTS YBCO thin films

Physica C: Superconductivity and its Applications

Volumn 408-410, Issue 1-4, 2004, Pages 846-847

  Soifer, Yakov M ^a   Verdyan, Armen ^a   Lapsker, Igor ^a   Azoulay, Jacob ^a  

^a HOLON INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

AFM; HTS thin films; Mechanical properties

Indexed keywords

BUFFER LAYERS; EXFOLIATION; NANOINDENTATION; NANOSCRATCHING;

ATOMIC FORCE MICROSCOPY; CRACKS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELASTIC MODULI; HARDNESS; HIGH TEMPERATURE SUPERCONDUCTORS; INDENTATION; MORPHOLOGY; POISSON RATIO; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SUPERCONDUCTING TRANSITION TEMPERATURE; X RAY DIFFRACTION ANALYSIS; YTTRIUM BARIUM COPPER OXIDES;

SUPERCONDUCTING FILMS;

EID: 4344588741     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2004.03.217     Document Type: Conference Paper

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