Characterizing the measurement precision of thermal resistance measurements

Applied Stochastic Models in Business and Industry

Volumn 20, Issue 3, 2004, Pages 239-251

  Engel, Jan ^a   Van Kempen, Joris ^a  

^a CQM   (Netherlands)

Author keywords

Bayesian model averaging; Model selection; Model uncertainty; Statistical modelling; Tolerance design

Indexed keywords

CALIBRATION; COMPUTER SIMULATION; CORRELATION METHODS; ERROR ANALYSIS; SENSORS; STATISTICAL METHODS;

MODEL SELECTION; MODEL UNCERTAINTY; STATISTICAL MODELING; TOLERANCE DESIGN;

HEAT RESISTANCE;

EID: 4344587179     PISSN: 15241904     EISSN: None     Source Type: Journal    
DOI: 10.1002/asmb.519     Document Type: Conference Paper

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