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Volumn 19, Issue 22, 2008, Pages
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An electron microscopy investigation of the structure of porous silicon by oxide replication
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLOGRAPHY;
OXIDATION;
PORE STRUCTURE;
REMOVAL;
SCANNING ELECTRON MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
CRYSTALLOGRAPHIC PROPAGATION;
FRACTAL STRUCTURE;
OXIDE REPLICATION;
SELECTIVE REMOVAL;
POROUS SILICON;
OXIDE;
SILICON;
ARTICLE;
CHEMICAL STRUCTURE;
COMPUTER PROGRAM;
CRYSTALLOGRAPHY;
ELECTRON MICROSCOPY;
GEOMETRY;
NONHUMAN;
OXIDATION;
POROSITY;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
STEREORADIOGRAPHY;
STRUCTURE ANALYSIS;
THREE DIMENSIONAL IMAGING;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 43249087484
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/19/22/225301 Document Type: Article |
Times cited : (9)
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References (13)
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