A detailed ray-tracing simulation of the high resolution microbeam at the AIFIRA facility

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 8, 2008, Pages 1653-1658

  Andersson, F ^a   Barberet, Ph ^a   Incerti, S ^a   Moretto, Ph ^a  

^a UNIVERSITÉ DE BORDEAUX   (France)

Author keywords

Geant4; Ion beam applications; Monte Carlo; Ray tracing

Indexed keywords

ALPHA PARTICLES; ION BEAMS; MONTE CARLO METHODS; PROTONS;

BEAM DEFLECTION; GRID SHADOW IMAGES; SYSTEM ALIGNMENT;

RAY TRACING;

EID: 43049173390     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.11.020     Document Type: Article

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