OTP memory for low cost passive RFID tags

IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007

Volumn , Issue , 2007, Pages 633-636

  Lee, Man Chiu ^a   Barsatan, Randy ^a   Chan, Mansun ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONALITY; NON-VOLATILE MEMORY (NVM); ONE TIME PROGRAMMABLE (OTP);

CMOS INTEGRATED CIRCUITS; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; ELECTRIC SWITCHES;

RADIO FREQUENCY IDENTIFICATION (RFID);

EID: 43049159273     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EDSSC.2007.4450204     Document Type: Conference Paper

References (7)

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3. V. Jain, S. Nariani, C. Gabriel, W. Boardman, D. Chan, K. Y. Chang, K. Gordon, R. Wong, "Amorphous silicon anti-fuse for high-speed FPGA application," Proceedings of Fifth Annual IEEE International ASIC Conference and Exhibit, 21-25 Sept. 1992 pp. 111 - 114.
4. Candelier, P.; Villani, N.; Schoellkopf, J.-P.; Mortini, P., "One-time programmable drift antiuse cell reliability", IEEE International Reliability Physics Symposium, 2000., April 2000, pp. 169-173
5. J. Teichmann, K. Burger, W. Hasche, J. Herrfurth, and G. Taschner, "One time programming (OTP) with Zener diodes in CMOS processes", 33rd Conference on ESSDERC '03, 16-18 Sept. 2003 pp. 433 - 436.
6. M. Allen, C. Lucas, "High Voltage Tolerant Switch Constructed for a Low Voltage CMOS Process", US PN. 5 434 531, March. 1995.
7. R. Barsatan, T. Y. Man, and M. Chan, "A CMOS-Compatible WORM Memory for Low-Cost Non-Volatile Memory Applications", EDSSC'05, pp. 339-342, Dec, 2005