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Volumn 69, Issue 3, 2008, Pages 733-737

Surface enhanced Raman scattering (SERS) activity studies of Si, Fe, Ti, Al and Ag films' prepared by magnetron sputtering

Author keywords

Films; Magnetron sputtering; p Hydroxybenzoic acid; SERS

Indexed keywords

ATOMIC FORCE MICROSCOPY; MAGNETRON SPUTTERING; SEMICONDUCTING FILMS; TRANSITION METALS;

HYDROXYBENZOIC ACID; TRANSITIONAL METAL FILMS;

RAMAN SCATTERING;

4 HYDROXYBENZOIC ACID ESTER; ALUMINUM; IRON; METAL; SILICON; SILVER; TITANIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; MAGNETISM; RAMAN SPECTROMETRY; TIME;

ALUMINUM; IRON; MAGNETICS; METALS; MICROSCOPY, ATOMIC FORCE; PARABENS; SILICON; SILVER; SPECTRUM ANALYSIS, RAMAN; TIME FACTORS; TITANIUM;

EID: 43049148362 PISSN: 13861425 EISSN: None Source Type: Journal
DOI: 10.1016/j.saa.2007.05.030 Document Type: Article

Times cited : (30)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.