Comparison of photoluminescence and capacitance spectroscopies as efficient tools for interface characterisation of heterojunction solar cells

Journal of Non-Crystalline Solids

Volumn 354, Issue 19-25, 2008, Pages 2416-2420

  Chouffot, R ^a   Ibrahim, S ^a   Bruggemann R ^b   Gudovskikh, A S ^a,c   Kleider, J P ^a   Scherff, M ^d   Fahrner, W R ^d   Cabarrocas, P Roca i ^e   Eon, D ^e   Ribeyron, P J ^f  

^a UNIV PARIS SUD   (France)

^b UNIVERSITY OF OLDENBURG   (Germany)

^c RUSSIAN ACADEMY OF SCIENCES   (Russian Federation)

^d UNIVERSITY OF HAGEN   (Germany)

^e LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

^f CEA GRENOBLE   (France)

Author keywords

Defects; Heterojunctions; Modeling and simulation; Optical spectroscopy; Photovoltaics; Silicon; Solar cells

Indexed keywords

COMPUTER SIMULATION; EMISSION SPECTROSCOPY; HETEROJUNCTIONS; MATHEMATICAL MODELS; PHOTOVOLTAIC CELLS; SILICON; SOLAR CELLS;

CRYSTALLINE SILICON; HETEROJUNCTION SOLAR CELLS; RECOMBINATION VELOCITY;

PHOTOLUMINESCENCE;

EID: 43049123200     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2007.09.032     Document Type: Article

References (8)

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7. Gudovskikh A.S., and Kleider J.P. Appl. Phys. Lett. 90 (2007) 034104
8. Würfel P. Physics of Solar Cells (2005), Wiley-VCH, Weinheim