Capacitance spectroscopy of amorphous/crystalline silicon heterojunction solar cells at forward bias and under illumination

Applied Physics Letters

Volumn 90, Issue 3, 2007, Pages

  Gudovskikh, A S ^a   Kleider, J P ^a  

^a UNIV PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; ELECTRIC POTENTIAL; HETEROJUNCTIONS; INTERFACES (MATERIALS); SOLAR CELLS; SPECTROSCOPIC ANALYSIS;

INTERFACE DEFECT DENSITY; MINORITY CARRIERS; OPEN-CIRCUIT VOLTAGE; RECOMBINATION VELOCITY;

AMORPHOUS SILICON;

EID: 33846428384     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2431783     Document Type: Article

References (8)

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