Electron spectroscopy analysis on NbN to grow and characterize NbN/AlN/NbN Josephson junction

Superlattices and Microstructures

Volumn 43, Issue 5-6, 2008, Pages 518-523

  Lucci, M ^a   Thanh, H N ^b   Davoli, I ^a  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b VIETNAM NATIONAL UNIVERSITY   (Viet Nam)

Author keywords

Electronic spectroscopy; Josephson junction; Nitride; Superconducting

Indexed keywords

CHARACTERIZATION; ELECTRON SPECTROSCOPY; GAS MIXTURES; NIOBIUM COMPOUNDS; PHOTOLITHOGRAPHY; SPUTTERING; SUPERCONDUCTING FILMS; X RAY DIFFRACTION ANALYSIS;

CRITICAL TEMPERATURE; CRYOCOOLERS; SPUTTERING PARAMETERS;

JOSEPHSON JUNCTION DEVICES;

EID: 43049102431     PISSN: 07496036     EISSN: 10963677     Source Type: Journal    
DOI: 10.1016/j.spmi.2007.07.029     Document Type: Article

References (4)

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4. Lucci M., Sanna S., Contini G., Zema N., Merlo V., Salvato M., Thanh H.N., and Davoli I. Surf. Sci. 601 (2007) 2647-2650