Electron spectroscopy study in the NbN growth for NbN/AlN interfaces

Surface Science

Volumn 601, Issue 13, 2007, Pages 2647-2650

  Lucci, M ^a   Sanna, S ^a   Contini, G ^b   Zema, N ^b   Merlo, V ^a   Salvato, M ^a,d   Thanh, H N ^a,c   Davoli, I ^a  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b CNR   (Italy)

^c VIETNAM NATIONAL UNIVERSITY   (Viet Nam)

^d Laboratorio Regionale SuperMat   (Italy)

Author keywords

AlN; Electron spectroscopy; Josephson junctions; NbN; Superconducting

Indexed keywords

ALUMINUM COMPOUNDS; ELECTRON SPECTROSCOPY; ENERGY GAP; INTERFACES (MATERIALS); JOSEPHSON JUNCTION DEVICES; NIOBIUM COMPOUNDS; SUPERCONDUCTING MATERIALS; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

JOSEPHSON JUNCTIONS; TERAHERTZ FREQUENCIES;

FILM GROWTH;

EID: 34250872829     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2006.11.078     Document Type: Article

References (7)

1. Wang Z., Kawakami A., and Uzawa Y. Physica C 282-287 (1997) 2465
2. Wang Z., and Kawakami A. IEEE Trans. Appl. Supercon. 5 (1995) 2322
3. Uzawa Y., Takeda M., Kawakami A., and Wang Z. IEEE Trans. Appl. Supercon. 13 (2003) 688
4. Delaet B., Villegier J.C., Escoffier W., Thomassin J.L., Feautrier P., Wang I., Renaud-Goud P., and Poizat J.P. NIM A 520 (2004) 541
5. Havey K.S., Zabinsky J.S., and Walck S.D. Thin Solid Films 303 (1997) 238
6. Yoshimori S., Mizushima K., Takey S., et al. Supercon. Sci. Technol. 9 (1996) A144
7. Kang L., Wu P.H., Sh J.R., Cai W.X., Yang S.Z., Ji Z.M., and Wang Z. Supercon. Sci. Technol. 16 (2003) 1417