Characterization of CuIn1 - xAlxS2 thin films prepared by thermal evaporation

Materials Science and Engineering C

Volumn 28, Issue 5-6, 2008, Pages 954-958

  F Smaili ^a   Kanzari, M ^a   Rezig, B ^a  

^a UNIVERSITY OF TUNIS EL MANAR   (Tunisia)

Author keywords

Amorphous semiconductors; Bridgman ingots; CuIn1 xAlxS2; Optical property

Indexed keywords

COPPER COMPOUNDS; OPTICAL PROPERTIES; SINGLE CRYSTALS; THERMAL EVAPORATION; X RAY DIFFRACTION ANALYSIS;

BRIDGMAN INGOTS; DIRECT BANDGAP;

THIN FILMS;

EID: 42949179423     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msec.2007.10.033     Document Type: Article

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