Dual chopped photoreflectance spectroscopy for nondestructive characterization of semiconductors and semiconductor nanostructures

Review of Scientific Instruments

Volumn 79, Issue 4, 2008, Pages

  Kita, Takashi ^a   Yamada, Masahiro ^a   Wada, Osamu ^a  

^a KOBE UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; LIGHT SCATTERING; NANOSTRUCTURES; PHOTOLUMINESCENCE; SIGNAL DETECTION; SPECTROSCOPIC ANALYSIS;

ELECTROMODULATED REFLECTANCE; ELECTRONIC BAND STRUCTURE; PHOTOREFLECTANCE SPECTROSCOPY;

SEMICONDUCTOR MATERIALS;

EID: 42949124531     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2913334     Document Type: Article

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